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Remote Tracking of Phase Changes in Cr(2)AlC Thin Films by In-situ Resistivity Measurements
Resistivity changes of magnetron sputtered, amorphous Cr(2)AlC thin films were measured during heating in vacuum. Based on correlative X-ray diffraction, in-situ and ex-situ selected area electron diffraction measurements and differential scanning calorimetry data from literature it is evident that...
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| Publicado no: | Sci Rep |
|---|---|
| Main Authors: | , , , , , , , , |
| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado em: |
Nature Publishing Group UK
2019
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| Assuntos: | |
| Acesso em linha: | https://ncbi.nlm.nih.gov/pmc/articles/PMC6547878/ https://ncbi.nlm.nih.gov/pubmed/31164687 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/s41598-019-44692-4 |
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