Stelzer, B., Chen, X., Bliem, P., Hans, M., Völker, B., Sahu, R., . . . Schneider, J. M. (2019). Remote Tracking of Phase Changes in Cr(2)AlC Thin Films by In-situ Resistivity Measurements. Sci Rep.
Chicago-stil citatStelzer, Bastian, Xiang Chen, Pascal Bliem, Marcus Hans, Bernhard Völker, Rajib Sahu, Christina Scheu, Daniel Primetzhofer, och Jochen M. Schneider. "Remote Tracking of Phase Changes in Cr(2)AlC Thin Films By In-situ Resistivity Measurements." Sci Rep 2019.
MLA-referensStelzer, Bastian, et al. "Remote Tracking of Phase Changes in Cr(2)AlC Thin Films By In-situ Resistivity Measurements." Sci Rep 2019.
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