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High spectral resolution second harmonic generation microspectroscopy at thin layer interfaces with broadband continuum pulses
We demonstrate an effective microspectroscopy technique by tracing the dispersion of second order nonlinear optical susceptibility χ((2)) in single atomic layer materials. The experimental method relies on the detection of single-shot second harmonic (SH) spectra from the materials and the subsequen...
Tallennettuna:
| Julkaisussa: | MethodsX |
|---|---|
| Päätekijät: | , , |
| Aineistotyyppi: | Artigo |
| Kieli: | Inglês |
| Julkaistu: |
Elsevier
2019
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| Aiheet: | |
| Linkit: | https://ncbi.nlm.nih.gov/pmc/articles/PMC6500909/ https://ncbi.nlm.nih.gov/pubmed/31080755 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1016/j.mex.2019.04.015 |
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