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Contactless THz-based bulk semiconductor mobility measurements using two-photon excitation
We perform contactless bulk mobility measurements for ZnSe, ZnTe, GaP, CdS, and GaSe in an optical pump THz probe experiment. As opposed to above-gap excitation or contact methods, two-photon absorption excites the entire sample thickness producing measurable signals with 10(13) carriers/cm(3) and h...
Tallennettuna:
| Julkaisussa: | Opt Express |
|---|---|
| Päätekijät: | , |
| Aineistotyyppi: | Artigo |
| Kieli: | Inglês |
| Julkaistu: |
2018
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| Aiheet: | |
| Linkit: | https://ncbi.nlm.nih.gov/pmc/articles/PMC6460479/ https://ncbi.nlm.nih.gov/pubmed/30469943 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1364/OE.26.029848 |
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