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Direct comparison of time-resolved Terahertz spectroscopy and Hall Van der Pauw methods for measurement of carrier conductivity and mobility in bulk semiconductors

Charge carrier conductivity and mobility for various semiconductor wafers and crystals were measured by ultrafast above bandgap, optically excited Time-Resolved Terahertz Spectroscopy (TRTS) and Hall Van der Pauw contact methods to directly compare these approaches and validate the use of the non-co...

詳細記述

保存先:
書誌詳細
出版年:J Opt Soc Am B
主要な著者: Alberding, Brian G., Thurber, W. Robert, Heilweil, Edwin J.
フォーマット: Artigo
言語:Inglês
出版事項: 2017
主題:
オンライン・アクセス:https://ncbi.nlm.nih.gov/pmc/articles/PMC5600209/
https://ncbi.nlm.nih.gov/pubmed/28924327
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1364/JOSAB.34.001392
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