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Lithium ion trapping mechanism of SiO(2) in LiCoO(2) based memristors
Pt/LiCoO(2)/SiO(2)/Si stacks with different SiO(2) thicknesses are fabricated and the influence of SiO(2) on memristive behavior is investigated. It is demonstrated that SiO(2) can serve as Li ion trapping layer benefiting device retention, and the thickness of SiO(2) must be controlled to avoid lar...
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| 出版年: | Sci Rep |
|---|---|
| 主要な著者: | , , , , , , , , |
| フォーマット: | Artigo |
| 言語: | Inglês |
| 出版事項: |
Nature Publishing Group UK
2019
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| 主題: | |
| オンライン･アクセス: | https://ncbi.nlm.nih.gov/pmc/articles/PMC6434038/ https://ncbi.nlm.nih.gov/pubmed/30911041 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/s41598-019-41508-3 |
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