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Lithium ion trapping mechanism of SiO(2) in LiCoO(2) based memristors
Pt/LiCoO(2)/SiO(2)/Si stacks with different SiO(2) thicknesses are fabricated and the influence of SiO(2) on memristive behavior is investigated. It is demonstrated that SiO(2) can serve as Li ion trapping layer benefiting device retention, and the thickness of SiO(2) must be controlled to avoid lar...
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| Publicat a: | Sci Rep |
|---|---|
| Autors principals: | , , , , , , , , |
| Format: | Artigo |
| Idioma: | Inglês |
| Publicat: |
Nature Publishing Group UK
2019
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| Matèries: | |
| Accés en línia: | https://ncbi.nlm.nih.gov/pmc/articles/PMC6434038/ https://ncbi.nlm.nih.gov/pubmed/30911041 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/s41598-019-41508-3 |
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