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Atomic electrostatic maps of 1D channels in 2D semiconductors using 4D scanning transmission electron microscopy

Defects in materials give rise to fluctuations in electrostatic fields that reflect the local charge density, but imaging this with single atom sensitivity is challenging. However, if possible, this provides information about the energetics of adatom binding, localized conduction channels, molecular...

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Bibliografske podrobnosti
izdano v:Nat Commun
Main Authors: Fang, Shiang, Wen, Yi, Allen, Christopher S., Ophus, Colin, Han, Grace G. D., Kirkland, Angus I., Kaxiras, Efthimios, Warner, Jamie H.
Format: Artigo
Jezik:Inglês
Izdano: Nature Publishing Group UK 2019
Teme:
Online dostop:https://ncbi.nlm.nih.gov/pmc/articles/PMC6408534/
https://ncbi.nlm.nih.gov/pubmed/30850616
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/s41467-019-08904-9
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