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Atomic Resolution Defocused Electron Ptychography at Low Dose with a Fast, Direct Electron Detector
Electron ptychography has recently attracted considerable interest for high resolution phase-sensitive imaging. However, to date studies have been mainly limited to radiation resistant samples as the electron dose required to record a ptychographic dataset is too high for use with beam-sensitive mat...
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| Vydáno v: | Sci Rep |
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| Hlavní autoři: | , , , , , , , , |
| Médium: | Artigo |
| Jazyk: | Inglês |
| Vydáno: |
Nature Publishing Group UK
2019
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| Témata: | |
| On-line přístup: | https://ncbi.nlm.nih.gov/pmc/articles/PMC6408533/ https://ncbi.nlm.nih.gov/pubmed/30850641 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/s41598-019-40413-z |
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