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High-Sensitivity Microwave Sensor Based on an Interdigital-Capacitor-Shaped Defected Ground Structure for Permittivity Characterization
This study proposes a high-sensitivity microwave sensor based on an interdigital-capacitor-shaped defected ground structure (IDCS-DGS) in a microstrip transmission line for the dielectric characterization of planar materials. The proposed IDCS-DGS was designed by modifying the straight ridge structu...
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| Vydáno v: | Sensors (Basel) |
|---|---|
| Hlavní autoři: | , |
| Médium: | Artigo |
| Jazyk: | Inglês |
| Vydáno: |
MDPI
2019
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| Témata: | |
| On-line přístup: | https://ncbi.nlm.nih.gov/pmc/articles/PMC6387108/ https://ncbi.nlm.nih.gov/pubmed/30691037 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3390/s19030498 |
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