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Understanding Current Instabilities in Conductive Atomic Force Microscopy
Conductive atomic force microscopy (CAFM) is one of the most powerful techniques in studying the electrical properties of various materials at the nanoscale. However, understanding current fluctuations within one study (due to degradation of the probe tips) and from one study to another (due to the...
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| Udgivet i: | Materials (Basel) |
|---|---|
| Main Authors: | , , , , , , , |
| Format: | Artigo |
| Sprog: | Inglês |
| Udgivet: |
MDPI
2019
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| Fag: | |
| Online adgang: | https://ncbi.nlm.nih.gov/pmc/articles/PMC6384822/ https://ncbi.nlm.nih.gov/pubmed/30717254 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3390/ma12030459 |
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