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A Bayesian approach to beam-induced motion correction in cryo-EM single-particle analysis
A new method to estimate the trajectories of particle motion and the amount of cumulative beam damage in electron cryo-microscopy (cryo-EM) single-particle analysis is presented. The motion within the sample is modelled through the use of Gaussian process regression. This allows a prior likelihood t...
Gardado en:
| Publicado en: | IUCrJ |
|---|---|
| Main Authors: | , , |
| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado: |
International Union of Crystallography
2019
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| Assuntos: | |
| Acceso en liña: | https://ncbi.nlm.nih.gov/pmc/articles/PMC6327179/ https://ncbi.nlm.nih.gov/pubmed/30713699 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1107/S205225251801463X |
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