Genome-wide association mapping of spot blotch resistance in wheat association mapping initiative (WAMI) panel of spring wheat (Triticum aestivum L.)

Spot blotch (SB) caused by Bipolaris sorokiniana, is one of the most important diseases of wheat in the eastern part of south Asia causing considerable yield loss to the wheat crop. There is an urgent need to identify genetic loci closely associated with resistance to this pathogen for developing re...

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Dades bibliogràfiques
Publicat a:PLoS One
Autors principals: Ahirwar, Ram Narayan, Mishra, Vinod Kumar, Chand, Ramesh, Budhlakoti, Neeraj, Mishra, Dwijesh Chandra, Kumar, Sundeep, Singh, Shweta, Joshi, Arun Kumar
Format: Artigo
Idioma:Inglês
Publicat: Public Library of Science 2018
Matèries:
Research Article
Accés en línia:https://ncbi.nlm.nih.gov/pmc/articles/PMC6296536/
https://ncbi.nlm.nih.gov/pubmed/30557301
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1371/journal.pone.0208196
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