Genome-wide association mapping of spot blotch resistance in wheat association mapping initiative (WAMI) panel of spring wheat (Triticum aestivum L.)

Spot blotch (SB) caused by Bipolaris sorokiniana, is one of the most important diseases of wheat in the eastern part of south Asia causing considerable yield loss to the wheat crop. There is an urgent need to identify genetic loci closely associated with resistance to this pathogen for developing re...

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Detalhes bibliográficos
Publicado no:PLoS One
Main Authors: Ahirwar, Ram Narayan, Mishra, Vinod Kumar, Chand, Ramesh, Budhlakoti, Neeraj, Mishra, Dwijesh Chandra, Kumar, Sundeep, Singh, Shweta, Joshi, Arun Kumar
Formato: Artigo
Idioma:Inglês
Publicado em: Public Library of Science 2018
Assuntos:
Research Article
Acesso em linha:https://ncbi.nlm.nih.gov/pmc/articles/PMC6296536/
https://ncbi.nlm.nih.gov/pubmed/30557301
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1371/journal.pone.0208196
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