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Observation of wet specimens sensitive to evaporation using scanning electron microscopy

Wet specimens are notoriously difficult to image in scanning electron microscopes (SEM) owing to evaporation from the required vacuum of the specimen chamber. Traditionally, this issue has been addressed by increasing the specimen chamber pressure. Unfortunately, observation under high specimen cham...

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Detaylı Bibliyografya
Yayımlandı:Microscopy (Oxf)
Asıl Yazarlar: Inoue, Noriyuki, Takashima, Yoshiko, Suga, Mitsuo, Suzuki, Toshiaki, Nemoto, Yoshikazu, Takai, Osamu
Materyal Türü: Artigo
Dil:Inglês
Baskı/Yayın Bilgisi: Oxford University Press 2018
Konular:
Online Erişim:https://ncbi.nlm.nih.gov/pmc/articles/PMC6278750/
https://ncbi.nlm.nih.gov/pubmed/30307558
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1093/jmicro/dfy041
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