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Observation of wet specimens sensitive to evaporation using scanning electron microscopy

Wet specimens are notoriously difficult to image in scanning electron microscopes (SEM) owing to evaporation from the required vacuum of the specimen chamber. Traditionally, this issue has been addressed by increasing the specimen chamber pressure. Unfortunately, observation under high specimen cham...

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Detalhes bibliográficos
Publicado no:Microscopy (Oxf)
Main Authors: Inoue, Noriyuki, Takashima, Yoshiko, Suga, Mitsuo, Suzuki, Toshiaki, Nemoto, Yoshikazu, Takai, Osamu
Formato: Artigo
Idioma:Inglês
Publicado em: Oxford University Press 2018
Assuntos:
Acesso em linha:https://ncbi.nlm.nih.gov/pmc/articles/PMC6278750/
https://ncbi.nlm.nih.gov/pubmed/30307558
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1093/jmicro/dfy041
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