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Observation of wet specimens sensitive to evaporation using scanning electron microscopy
Wet specimens are notoriously difficult to image in scanning electron microscopes (SEM) owing to evaporation from the required vacuum of the specimen chamber. Traditionally, this issue has been addressed by increasing the specimen chamber pressure. Unfortunately, observation under high specimen cham...
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| Publicado no: | Microscopy (Oxf) |
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| Main Authors: | , , , , , |
| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado em: |
Oxford University Press
2018
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| Assuntos: | |
| Acesso em linha: | https://ncbi.nlm.nih.gov/pmc/articles/PMC6278750/ https://ncbi.nlm.nih.gov/pubmed/30307558 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1093/jmicro/dfy041 |
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