Rayleigh-scattering microscopy for tracking and sizing nanoparticles in focused aerosol beams

Ultra-bright femtosecond X-ray pulses generated by X-ray free-electron lasers (XFELs) can be used to image high-resolution structures without the need for crystallization. For this approach, aerosol injection has been a successful method to deliver 70–2000 nm particles into the XFEL beam efficiently...

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Shranjeno v:
Bibliografske podrobnosti
izdano v:IUCrJ
Main Authors: Hantke, Max F., Bielecki, Johan, Kulyk, Olena, Westphal, Daniel, Larsson, Daniel S. D., Svenda, Martin, Reddy, Hemanth K. N., Kirian, Richard A., Andreasson, Jakob, Hajdu, Janos, Maia, Filipe R. N. C.
Format: Artigo
Jezik:Inglês
Izdano: International Union of Crystallography 2018
Teme:
Research Papers
Online dostop:https://ncbi.nlm.nih.gov/pmc/articles/PMC6211534/
https://ncbi.nlm.nih.gov/pubmed/30443352
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1107/S2052252518010837
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