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Rayleigh-scattering microscopy for tracking and sizing nanoparticles in focused aerosol beams
Ultra-bright femtosecond X-ray pulses generated by X-ray free-electron lasers (XFELs) can be used to image high-resolution structures without the need for crystallization. For this approach, aerosol injection has been a successful method to deliver 70–2000 nm particles into the XFEL beam efficiently...
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| Опубликовано в: : | IUCrJ |
|---|---|
| Главные авторы: | , , , , , , , , , , |
| Формат: | Artigo |
| Язык: | Inglês |
| Опубликовано: |
International Union of Crystallography
2018
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| Предметы: | |
| Online-ссылка: | https://ncbi.nlm.nih.gov/pmc/articles/PMC6211534/ https://ncbi.nlm.nih.gov/pubmed/30443352 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1107/S2052252518010837 |
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