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Soft X-ray Reflection Spectroscopy for Nano-Scaled Layered Structure Materials
We introduce a novel approach that addresses the probing of interfacial structural phenomena in layered nano-structured films. The approach combines resonant soft x-ray reflection spectroscopy at grazing incidence near the “critical angle” with angular dependent reflection at energies around the res...
Gorde:
| Argitaratua izan da: | Sci Rep |
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| Egile Nagusiak: | , , , , , |
| Formatua: | Artigo |
| Hizkuntza: | Inglês |
| Argitaratua: |
Nature Publishing Group UK
2018
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| Gaiak: | |
| Sarrera elektronikoa: | https://ncbi.nlm.nih.gov/pmc/articles/PMC6200723/ https://ncbi.nlm.nih.gov/pubmed/30356092 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/s41598-018-34076-5 |
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