A carregar...

Soft X-ray Reflection Spectroscopy for Nano-Scaled Layered Structure Materials

We introduce a novel approach that addresses the probing of interfacial structural phenomena in layered nano-structured films. The approach combines resonant soft x-ray reflection spectroscopy at grazing incidence near the “critical angle” with angular dependent reflection at energies around the res...

ver descrição completa

Na minha lista:
Detalhes bibliográficos
Publicado no:Sci Rep
Main Authors: Majhi, A., Nayak, Maheswar, Pradhan, P. C., Filatova, E. O., Sokolov, A., Schäfers, F.
Formato: Artigo
Idioma:Inglês
Publicado em: Nature Publishing Group UK 2018
Assuntos:
Acesso em linha:https://ncbi.nlm.nih.gov/pmc/articles/PMC6200723/
https://ncbi.nlm.nih.gov/pubmed/30356092
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/s41598-018-34076-5
Tags: Adicionar Tag
Sem tags, seja o primeiro a adicionar uma tag!