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On the Use of Focused Incident Near-Field Beams in Microwave Imaging
We consider the use of focused incident near-field (NF) beams to interrogate the object of interest (OI) in NF microwave imaging (MWI). To this end, we first discuss how focused NF beams can be advantageously utilized to suppress scattering effects from the neighbouring objects whose unknown dielect...
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| Publicat a: | Sensors (Basel) |
|---|---|
| Autors principals: | , |
| Format: | Artigo |
| Idioma: | Inglês |
| Publicat: |
MDPI
2018
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| Matèries: | |
| Accés en línia: | https://ncbi.nlm.nih.gov/pmc/articles/PMC6165484/ https://ncbi.nlm.nih.gov/pubmed/30227593 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3390/s18093127 |
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