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On the Use of Focused Incident Near-Field Beams in Microwave Imaging
We consider the use of focused incident near-field (NF) beams to interrogate the object of interest (OI) in NF microwave imaging (MWI). To this end, we first discuss how focused NF beams can be advantageously utilized to suppress scattering effects from the neighbouring objects whose unknown dielect...
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| Vydáno v: | Sensors (Basel) |
|---|---|
| Hlavní autoři: | , |
| Médium: | Artigo |
| Jazyk: | Inglês |
| Vydáno: |
MDPI
2018
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| Témata: | |
| On-line přístup: | https://ncbi.nlm.nih.gov/pmc/articles/PMC6165484/ https://ncbi.nlm.nih.gov/pubmed/30227593 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3390/s18093127 |
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