Carregant...
Fabrication and Characterization of a High-Performance Multi-Annular Backscattered Electron Detector for Desktop SEM †
Scanning electron microscopy has been developed for topographic analysis at the nanometer scale. Herein, we present a silicon p-n diode with multi-annular configuration to detect backscattering electrons (BSE) in a homemade desktop scanning electron microscope (SEM). The multi-annular configuration...
Guardat en:
| Publicat a: | Sensors (Basel) |
|---|---|
| Autors principals: | , , , , |
| Format: | Artigo |
| Idioma: | Inglês |
| Publicat: |
MDPI
2018
|
| Matèries: | |
| Accés en línia: | https://ncbi.nlm.nih.gov/pmc/articles/PMC6163608/ https://ncbi.nlm.nih.gov/pubmed/30223459 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3390/s18093093 |
| Etiquetes: |
Afegir etiqueta
Sense etiquetes, Sigues el primer a etiquetar aquest registre!
|