Contrast of Backscattered Electron SEM Images of Nanoparticles on Substrates with Complex Structure

This study is concerned with backscattered electron scanning electron microscopy (BSE SEM) contrast of complex nanoscaled samples which consist of SiO(2) nanoparticles (NPs) deposited on indium-tin-oxide covered bulk SiO(2) and glassy carbon substrates. BSE SEM contrast of NPs is studied as function...

Deskribapen osoa

Gorde:
Xehetasun bibliografikoak
Argitaratua izan da:Scanning
Egile Nagusiak: Kowoll, Thomas, Müller, Erich, Fritsch-Decker, Susanne, Hettler, Simon, Störmer, Heike, Weiss, Carsten, Gerthsen, Dagmar
Formatua: Artigo
Hizkuntza:Inglês
Argitaratua: Hindawi 2017
Gaiak:
Research Article
Sarrera elektronikoa:https://ncbi.nlm.nih.gov/pmc/articles/PMC5661778/
https://ncbi.nlm.nih.gov/pubmed/29109816
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1155/2017/4907457
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