Contrast of Backscattered Electron SEM Images of Nanoparticles on Substrates with Complex Structure

This study is concerned with backscattered electron scanning electron microscopy (BSE SEM) contrast of complex nanoscaled samples which consist of SiO(2) nanoparticles (NPs) deposited on indium-tin-oxide covered bulk SiO(2) and glassy carbon substrates. BSE SEM contrast of NPs is studied as function...

Cijeli opis

Spremljeno u:
Bibliografski detalji
Izdano u:Scanning
Glavni autori: Kowoll, Thomas, Müller, Erich, Fritsch-Decker, Susanne, Hettler, Simon, Störmer, Heike, Weiss, Carsten, Gerthsen, Dagmar
Format: Artigo
Jezik:Inglês
Izdano: Hindawi 2017
Teme:
Research Article
Online pristup:https://ncbi.nlm.nih.gov/pmc/articles/PMC5661778/
https://ncbi.nlm.nih.gov/pubmed/29109816
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1155/2017/4907457
Oznake: Dodaj oznaku
Bez oznaka, Budi prvi tko označuje ovaj zapis!

Similar Items