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Massively parallel fabrication of crack-defined gold break junctions featuring sub-3 nm gaps for molecular devices

Break junctions provide tip-shaped contact electrodes that are fundamental components of nano and molecular electronics. However, the fabrication of break junctions remains notoriously time-consuming and difficult to parallelize. Here we demonstrate true parallel fabrication of gold break junctions...

詳細記述

保存先:
書誌詳細
出版年:Nat Commun
主要な著者: Dubois, Valentin, Raja, Shyamprasad N., Gehring, Pascal, Caneva, Sabina, van der Zant, Herre S. J., Niklaus, Frank, Stemme, Göran
フォーマット: Artigo
言語:Inglês
出版事項: Nature Publishing Group UK 2018
主題:
オンライン・アクセス:https://ncbi.nlm.nih.gov/pmc/articles/PMC6109151/
https://ncbi.nlm.nih.gov/pubmed/30143636
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/s41467-018-05785-2
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