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Electron-Beam Manipulation of Silicon Dopants in Graphene
[Image: see text] The direct manipulation of individual atoms in materials using scanning probe microscopy has been a seminal achievement of nanotechnology. Recent advances in imaging resolution and sample stability have made scanning transmission electron microscopy a promising alternative for sing...
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| Vydáno v: | Nano Lett |
|---|---|
| Hlavní autoři: | , , , , , , , |
| Médium: | Artigo |
| Jazyk: | Inglês |
| Vydáno: |
American Chemical Society
2018
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| On-line přístup: | https://ncbi.nlm.nih.gov/pmc/articles/PMC6089495/ https://ncbi.nlm.nih.gov/pubmed/29945442 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1021/acs.nanolett.8b02406 |
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