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Potential Dip in Organic Photovoltaics Probed by Cross-sectional Kelvin Probe Force Microscopy
Cross-sectional potential distribution of high open-circuit voltage bulk heterojunction photovoltaic device was measured using Kelvin probe force microscopy. Potential drop confined at cathode interface implies that photo-active layer is an effective p-type semiconductor. Potential values in field-f...
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| Publicado en: | Nanoscale Res Lett |
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| Main Authors: | , |
| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado: |
Springer US
2018
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| Assuntos: | |
| Acceso en liña: | https://ncbi.nlm.nih.gov/pmc/articles/PMC6070447/ https://ncbi.nlm.nih.gov/pubmed/30069714 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1186/s11671-018-2639-6 |
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