טוען...
Compositional, ultrastructural and nanotechnological characterization of the SMA strain of Saccharomyces pastorianus: Towards a more complete fermentation yeast cell analysis
Nano scanning Auger microscopy (NanoSAM) and time-of-flight secondary ion mass spectrometry (TOF-SIMS) have been used in materials science research for some time, but NanoSAM, in particular, has only recently been applied to biological specimens. Here, the first concurrent utilization of NanoSAM, TO...
שמור ב:
| הוצא לאור ב: | PLoS One |
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| Main Authors: | , , , , , , , |
| פורמט: | Artigo |
| שפה: | Inglês |
| יצא לאור: |
Public Library of Science
2018
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| נושאים: | |
| גישה מקוונת: | https://ncbi.nlm.nih.gov/pmc/articles/PMC6040772/ https://ncbi.nlm.nih.gov/pubmed/29995965 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1371/journal.pone.0200552 |
| תגים: |
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