Genome-wide association mapping for resistance to leaf rust, stripe rust and tan spot in wheat reveals potential candidate genes

KEY MESSAGE: Genome-wide association mapping in conjunction with population sequencing map and Ensembl plants was used to identify markers/candidate genes linked to leaf rust, stripe rust and tan spot resistance in wheat. ABSTRACT: Leaf rust (LR), stripe rust (YR) and tan spot (TS) are some of the i...

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Shranjeno v:
Bibliografske podrobnosti
izdano v:Theor Appl Genet
Main Authors: Juliana, Philomin, Singh, Ravi P., Singh, Pawan K., Poland, Jesse A., Bergstrom, Gary C., Huerta-Espino, Julio, Bhavani, Sridhar, Crossa, Jose, Sorrells, Mark E.
Format: Artigo
Jezik:Inglês
Izdano: Springer Berlin Heidelberg 2018
Teme:
Original Article
Online dostop:https://ncbi.nlm.nih.gov/pmc/articles/PMC6004277/
https://ncbi.nlm.nih.gov/pubmed/29589041
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1007/s00122-018-3086-6
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