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Voltage and partial pressure dependent defect chemistry in (La,Sr)FeO(3–δ) thin films investigated by chemical capacitance measurements

La(0.6)Sr(0.4)FeO(3–δ) (LSF) thin films of different thickness were prepared by pulsed laser deposition on yttria stabilized zirconia (YSZ) and characterized by using three electrode impedance spectroscopy. Electrochemical film capacitance was analyzed in relation to oxygen partial pressure (0.25 mb...

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Detalhes bibliográficos
Publicado no:Phys Chem Chem Phys
Main Authors: Schmid, Alexander, Rupp, Ghislain M., Fleig, Jürgen
Formato: Artigo
Idioma:Inglês
Publicado em: Royal Society of Chemistry 2018
Assuntos:
Acesso em linha:https://ncbi.nlm.nih.gov/pmc/articles/PMC5932982/
https://ncbi.nlm.nih.gov/pubmed/29671421
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1039/c7cp07845e
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