Schmid, A., Rupp, G. M., & Fleig, J. (2018). Voltage and partial pressure dependent defect chemistry in (La,Sr)FeO(3–δ) thin films investigated by chemical capacitance measurements. Phys Chem Chem Phys.
Citação norma ChicagoSchmid, Alexander, Ghislain M. Rupp, and Jürgen Fleig. "Voltage and Partial Pressure Dependent Defect Chemistry in (La,Sr)FeO(3–δ) Thin Films Investigated By Chemical Capacitance Measurements." Phys Chem Chem Phys 2018.
Citação norma MLASchmid, Alexander, Ghislain M. Rupp, and Jürgen Fleig. "Voltage and Partial Pressure Dependent Defect Chemistry in (La,Sr)FeO(3–δ) Thin Films Investigated By Chemical Capacitance Measurements." Phys Chem Chem Phys 2018.
Nota: a formatação da citação pode não corresponder 100% ao definido pela respectiva norma.