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Quick X-ray reflectivity using monochromatic synchrotron radiation for time-resolved applications

A new technique for the parallel collection of X-ray reflectivity (XRR) data, compatible with monochromatic synchrotron radiation and flat substrates, is described and applied to the in situ observation of thin-film growth. The method employs a polycapillary X-ray optic to produce a converging fan o...

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Bibliografske podrobnosti
izdano v:J Synchrotron Radiat
Main Authors: Joress, H., Brock, J. D., Woll, A. R.
Format: Artigo
Jezik:Inglês
Izdano: International Union of Crystallography 2018
Teme:
Online dostop:https://ncbi.nlm.nih.gov/pmc/articles/PMC5929355/
https://ncbi.nlm.nih.gov/pubmed/29714180
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1107/S1600577518003004
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