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Quick X-ray reflectivity using monochromatic synchrotron radiation for time-resolved applications
A new technique for the parallel collection of X-ray reflectivity (XRR) data, compatible with monochromatic synchrotron radiation and flat substrates, is described and applied to the in situ observation of thin-film growth. The method employs a polycapillary X-ray optic to produce a converging fan o...
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| 發表在: | J Synchrotron Radiat |
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| Main Authors: | , , |
| 格式: | Artigo |
| 語言: | Inglês |
| 出版: |
International Union of Crystallography
2018
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| 主題: | |
| 在線閱讀: | https://ncbi.nlm.nih.gov/pmc/articles/PMC5929355/ https://ncbi.nlm.nih.gov/pubmed/29714180 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1107/S1600577518003004 |
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