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Automated image segmentation-assisted flattening of atomic force microscopy images
Atomic force microscopy (AFM) images normally exhibit various artifacts. As a result, image flattening is required prior to image analysis. To obtain optimized flattening results, foreground features are generally manually excluded using rectangular masks in image flattening, which is time consuming...
Gorde:
| Argitaratua izan da: | Beilstein J Nanotechnol |
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| Egile Nagusiak: | , , , |
| Formatua: | Artigo |
| Hizkuntza: | Inglês |
| Argitaratua: |
Beilstein-Institut
2018
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| Gaiak: | |
| Sarrera elektronikoa: | https://ncbi.nlm.nih.gov/pmc/articles/PMC5905267/ https://ncbi.nlm.nih.gov/pubmed/29719750 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3762/bjnano.9.91 |
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