In Situ Time-Resolved Attenuated Total Reflectance Infrared Spectroscopy for Probing Metal-Organic Framework Thin Film Growth

In situ chemical measurements of solution/surface reactions during metal-organic framework (MOF) thin film growth can provide valuable information about the mechanistic and kinetic aspects of key reaction steps, and allow control over crystal quality and material properties. Here, we report a new ap...

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Udgivet i:Chem Mater
Main Authors: Zhao, Junjie, Kalanyan, Berc, Barton, Heather F., Sperling, Brent A., Parsons, Gregory N.
Format: Artigo
Sprog:Inglês
Udgivet: 2017
Fag:
Article
Online adgang:https://ncbi.nlm.nih.gov/pmc/articles/PMC5846636/
https://ncbi.nlm.nih.gov/pubmed/29545675
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1021/acs.chemmater.7b03096
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