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Holographic Traction Force Microscopy

Traction Force Microscopy (TFM) computes the forces exerted at the surface of an elastic material by measuring induced deformations in volume. It is used to determine the pattern of the adhesion forces exerted by cells or by cellular assemblies grown onto a soft deformable substrate. Typically, coll...

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Publicat a:Sci Rep
Autors principals: Makarchuk, Stanislaw, Beyer, Nicolas, Gaiddon, Christian, Grange, Wilfried, Hébraud, Pascal
Format: Artigo
Idioma:Inglês
Publicat: Nature Publishing Group UK 2018
Matèries:
Accés en línia:https://ncbi.nlm.nih.gov/pmc/articles/PMC5813032/
https://ncbi.nlm.nih.gov/pubmed/29445207
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/s41598-018-21206-2
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