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Holographic Traction Force Microscopy

Traction Force Microscopy (TFM) computes the forces exerted at the surface of an elastic material by measuring induced deformations in volume. It is used to determine the pattern of the adhesion forces exerted by cells or by cellular assemblies grown onto a soft deformable substrate. Typically, coll...

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書目詳細資料
發表在:Sci Rep
Main Authors: Makarchuk, Stanislaw, Beyer, Nicolas, Gaiddon, Christian, Grange, Wilfried, Hébraud, Pascal
格式: Artigo
語言:Inglês
出版: Nature Publishing Group UK 2018
主題:
在線閱讀:https://ncbi.nlm.nih.gov/pmc/articles/PMC5813032/
https://ncbi.nlm.nih.gov/pubmed/29445207
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/s41598-018-21206-2
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