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Electroviscous Dissipation in Aqueous Electrolyte Films with Overlapping Electric Double Layers

[Image: see text] We use dynamic atomic force microscopy (AFM) to investigate the forces involved in squeezing out thin films of aqueous electrolyte between an AFM tip and silica substrates at variable pH and salt concentration. From amplitude and phase of the AFM signal we determine both conservati...

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Detalhes bibliográficos
Publicado no:J Phys Chem B
Main Authors: Liu, F., Klaassen, A., Zhao, C., Mugele, F., van den Ende, D.
Formato: Artigo
Idioma:Inglês
Publicado em: American Chemical Society 2017
Acesso em linha:https://ncbi.nlm.nih.gov/pmc/articles/PMC5776519/
https://ncbi.nlm.nih.gov/pubmed/28976197
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1021/acs.jpcb.7b07019
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