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Electroviscous Dissipation in Aqueous Electrolyte Films with Overlapping Electric Double Layers
[Image: see text] We use dynamic atomic force microscopy (AFM) to investigate the forces involved in squeezing out thin films of aqueous electrolyte between an AFM tip and silica substrates at variable pH and salt concentration. From amplitude and phase of the AFM signal we determine both conservati...
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| 出版年: | J Phys Chem B |
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| 主要な著者: | , , , , |
| フォーマット: | Artigo |
| 言語: | Inglês |
| 出版事項: |
American Chemical
Society
2017
|
| オンライン･アクセス: | https://ncbi.nlm.nih.gov/pmc/articles/PMC5776519/ https://ncbi.nlm.nih.gov/pubmed/28976197 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1021/acs.jpcb.7b07019 |
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