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Modeling and evaluation of a high‐resolution CMOS detector for cone‐beam CT of the extremities
PURPOSE: Quantitative assessment of trabecular bone microarchitecture in extremity cone‐beam CT (CBCT) would benefit from the high spatial resolution, low electronic noise, and fast scan time provided by complementary metal‐oxide semiconductor (CMOS) x‐ray detectors. We investigate the performance o...
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| Vydáno v: | Med Phys |
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| Hlavní autoři: | , , , , , , |
| Médium: | Artigo |
| Jazyk: | Inglês |
| Vydáno: |
John Wiley and Sons Inc.
2017
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| Témata: | |
| On-line přístup: | https://ncbi.nlm.nih.gov/pmc/articles/PMC5774240/ https://ncbi.nlm.nih.gov/pubmed/29095489 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1002/mp.12654 |
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