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High-resolution extremity cone-beam CT with a CMOS detector: Task-based optimization of scintillator thickness
PURPOSE: CMOS x-ray detectors offer small pixel sizes and low electronic noise that may support the development of novel high-resolution imaging applications of cone-beam CT (CBCT). We investigate the effects of CsI scintillator thickness on the performance of CMOS detectors in high resolution imagi...
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| Foilsithe in: | Proc SPIE Int Soc Opt Eng |
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| Main Authors: | , , , , , , |
| Formáid: | Artigo |
| Teanga: | Inglês |
| Foilsithe: |
2017
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| Ábhair: | |
| Rochtain Ar Líne: | https://ncbi.nlm.nih.gov/pmc/articles/PMC5630149/ https://ncbi.nlm.nih.gov/pubmed/28989220 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1117/12.2255695 |
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