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High-resolution extremity cone-beam CT with a CMOS detector: Task-based optimization of scintillator thickness
PURPOSE: CMOS x-ray detectors offer small pixel sizes and low electronic noise that may support the development of novel high-resolution imaging applications of cone-beam CT (CBCT). We investigate the effects of CsI scintillator thickness on the performance of CMOS detectors in high resolution imagi...
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| Vydáno v: | Proc SPIE Int Soc Opt Eng |
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| Hlavní autoři: | , , , , , , |
| Médium: | Artigo |
| Jazyk: | Inglês |
| Vydáno: |
2017
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| Témata: | |
| On-line přístup: | https://ncbi.nlm.nih.gov/pmc/articles/PMC5630149/ https://ncbi.nlm.nih.gov/pubmed/28989220 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1117/12.2255695 |
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