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Efficient high-order suppression system for a metrology beamline
High-quality metrology with synchrotron radiation requires in particular a very high spectral purity of the incident beam. This is usually achieved by a set of transmission filters with suitable absorption edges to suppress high-order radiation of the monochromator. The at-wavelength metrology stati...
Tallennettuna:
| Julkaisussa: | J Synchrotron Radiat |
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| Päätekijät: | , , , , |
| Aineistotyyppi: | Artigo |
| Kieli: | Inglês |
| Julkaistu: |
International Union of Crystallography
2018
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| Aiheet: | |
| Linkit: | https://ncbi.nlm.nih.gov/pmc/articles/PMC5741125/ https://ncbi.nlm.nih.gov/pubmed/29271758 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1107/S1600577517016800 |
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