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Probing the Surface Charge on the Basal Planes of Kaolinite Particles with High-Resolution Atomic Force Microscopy
[Image: see text] High-resolution atomic force microscopy is used to map the surface charge on the basal planes of kaolinite nanoparticles in an ambient solution of variable pH and NaCl or CaCl(2) concentration. Using DLVO theory with charge regulation, we determine from the measured force–distance...
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| Publicado no: | Langmuir |
|---|---|
| Main Authors: | , , , , |
| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado em: |
American
Chemical Society
2017
|
| Acesso em linha: | https://ncbi.nlm.nih.gov/pmc/articles/PMC5738629/ https://ncbi.nlm.nih.gov/pubmed/29140711 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1021/acs.langmuir.7b03153 |
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