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CHARGE syndrome modeling using patient-iPSCs reveals defective migration of neural crest cells harboring CHD7 mutations

CHARGE syndrome is caused by heterozygous mutations in the chromatin remodeler, CHD7, and is characterized by a set of malformations that, on clinical grounds, were historically postulated to arise from defects in neural crest formation during embryogenesis. To better delineate neural crest defects...

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Vydáno v:eLife
Hlavní autoři: Okuno, Hironobu, Renault Mihara, Francois, Ohta, Shigeki, Fukuda, Kimiko, Kurosawa, Kenji, Akamatsu, Wado, Sanosaka, Tsukasa, Kohyama, Jun, Hayashi, Kanehiro, Nakajima, Kazunori, Takahashi, Takao, Wysocka, Joanna, Kosaki, Kenjiro, Okano, Hideyuki
Médium: Artigo
Jazyk:Inglês
Vydáno: eLife Sciences Publications, Ltd 2017
Témata:
On-line přístup:https://ncbi.nlm.nih.gov/pmc/articles/PMC5705211/
https://ncbi.nlm.nih.gov/pubmed/29179815
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.7554/eLife.21114
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