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Full-wave modeling of broadband near field scanning microwave microscopy
A three-dimensional finite element numerical modeling for the scanning microwave microscopy (SMM) setup is applied to study the full-wave quantification of the local material properties of samples. The modeling takes into account the radiation and scattering losses of the nano-sized probe neglected...
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| Publicado no: | Sci Rep |
|---|---|
| Main Authors: | , , , |
| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado em: |
Nature Publishing Group UK
2017
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| Assuntos: | |
| Acesso em linha: | https://ncbi.nlm.nih.gov/pmc/articles/PMC5700110/ https://ncbi.nlm.nih.gov/pubmed/29167422 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/s41598-017-13937-5 |
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