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Characterization of MOSFET dosimeters for low‐dose measurements in maxillofacial anthropomorphic phantoms
The aims of this study were to characterize reinforced metal‐oxide‐semiconductor field‐effect transistor (MOSFET) dosimeters to assess the measurement uncertainty, single exposure low‐dose limit with acceptable accuracy, and the number of exposures required to attain the corresponding limit of the t...
Gorde:
| Argitaratua izan da: | J Appl Clin Med Phys |
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| Egile Nagusiak: | , , , , |
| Formatua: | Artigo |
| Hizkuntza: | Inglês |
| Argitaratua: |
John Wiley and Sons Inc.
2015
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| Gaiak: | |
| Sarrera elektronikoa: | https://ncbi.nlm.nih.gov/pmc/articles/PMC5690001/ https://ncbi.nlm.nih.gov/pubmed/26219008 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1120/jacmp.v16i4.5433 |
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