Carregant...
Modelling focused electron beam induced deposition beyond Langmuir adsorption
In this work, the continuum model for focused electron beam induced deposition (FEBID) is generalized to account for multilayer adsorption processes. Two types of adsorption energies, describing both physisorption and spontaneous chemisorption, are included. Steady state solutions under no diffusion...
Guardat en:
| Publicat a: | Beilstein J Nanotechnol |
|---|---|
| Autors principals: | , |
| Format: | Artigo |
| Idioma: | Inglês |
| Publicat: |
Beilstein-Institut
2017
|
| Matèries: | |
| Accés en línia: | https://ncbi.nlm.nih.gov/pmc/articles/PMC5647696/ https://ncbi.nlm.nih.gov/pubmed/29090116 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3762/bjnano.8.214 |
| Etiquetes: |
Afegir etiqueta
Sense etiquetes, Sigues el primer a etiquetar aquest registre!
|