Wird geladen...

A Multiscale Material Testing System for In Situ Optical and Electron Microscopes and Its Application

We report a novel material testing system (MTS) that uses hierarchical designs for in-situ mechanical characterization of multiscale materials. This MTS is adaptable for use in optical microscopes (OMs) and scanning electron microscopes (SEMs). The system consists of a microscale material testing mo...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Sensors (Basel)
Hauptverfasser: Ye, Xuan, Cui, Zhiguo, Fang, Huajun, Li, Xide
Format: Artigo
Sprache:Inglês
Veröffentlicht: MDPI 2017
Schlagworte:
Online Zugang:https://ncbi.nlm.nih.gov/pmc/articles/PMC5579585/
https://ncbi.nlm.nih.gov/pubmed/28777341
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3390/s17081800
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!