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A Multiscale Material Testing System for In Situ Optical and Electron Microscopes and Its Application

We report a novel material testing system (MTS) that uses hierarchical designs for in-situ mechanical characterization of multiscale materials. This MTS is adaptable for use in optical microscopes (OMs) and scanning electron microscopes (SEMs). The system consists of a microscale material testing mo...

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Publicat a:Sensors (Basel)
Autors principals: Ye, Xuan, Cui, Zhiguo, Fang, Huajun, Li, Xide
Format: Artigo
Idioma:Inglês
Publicat: MDPI 2017
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Accés en línia:https://ncbi.nlm.nih.gov/pmc/articles/PMC5579585/
https://ncbi.nlm.nih.gov/pubmed/28777341
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3390/s17081800
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