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A Multiscale Material Testing System for In Situ Optical and Electron Microscopes and Its Application
We report a novel material testing system (MTS) that uses hierarchical designs for in-situ mechanical characterization of multiscale materials. This MTS is adaptable for use in optical microscopes (OMs) and scanning electron microscopes (SEMs). The system consists of a microscale material testing mo...
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| Publicado no: | Sensors (Basel) |
|---|---|
| Main Authors: | , , , |
| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado em: |
MDPI
2017
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| Assuntos: | |
| Acesso em linha: | https://ncbi.nlm.nih.gov/pmc/articles/PMC5579585/ https://ncbi.nlm.nih.gov/pubmed/28777341 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3390/s17081800 |
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