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Enhanced FIB-SEM systems for large-volume 3D imaging
Focused Ion Beam Scanning Electron Microscopy (FIB-SEM) can automatically generate 3D images with superior z-axis resolution, yielding data that needs minimal image registration and related post-processing. Obstacles blocking wider adoption of FIB-SEM include slow imaging speed and lack of long-term...
Αποθηκεύτηκε σε:
| Τόπος έκδοσης: | eLife |
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| Κύριοι συγγραφείς: | , , , , , , , , , |
| Μορφή: | Artigo |
| Γλώσσα: | Inglês |
| Έκδοση: |
eLife Sciences Publications, Ltd
2017
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| Θέματα: | |
| Διαθέσιμο Online: | https://ncbi.nlm.nih.gov/pmc/articles/PMC5476429/ https://ncbi.nlm.nih.gov/pubmed/28500755 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.7554/eLife.25916 |
| Ετικέτες: |
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