Defect Dominated Charge Transport and Fermi Level Pinning in MoS(2)/Metal Contacts

[Image: see text] Understanding the electronic contact between molybdenum disulfide (MoS(2)) and metal electrodes is vital for the realization of future MoS(2)-based electronic devices. Natural MoS(2) has the drawback of a high density of both metal and sulfur defects and impurities. We present evid...

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Detaylı Bibliyografya
Yayımlandı:ACS Appl Mater Interfaces
Asıl Yazarlar: Bampoulis, Pantelis, van Bremen, Rik, Yao, Qirong, Poelsema, Bene, Zandvliet, Harold J. W., Sotthewes, Kai
Materyal Türü: Artigo
Dil:Inglês
Baskı/Yayın Bilgisi: American Chemical Society 2017
Online Erişim:https://ncbi.nlm.nih.gov/pmc/articles/PMC5465510/
https://ncbi.nlm.nih.gov/pubmed/28508628
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1021/acsami.7b02739
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