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Defect Dominated Charge Transport and Fermi Level Pinning in MoS(2)/Metal Contacts
[Image: see text] Understanding the electronic contact between molybdenum disulfide (MoS(2)) and metal electrodes is vital for the realization of future MoS(2)-based electronic devices. Natural MoS(2) has the drawback of a high density of both metal and sulfur defects and impurities. We present evid...
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| Vydáno v: | ACS Appl Mater Interfaces |
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| Hlavní autoři: | , , , , , |
| Médium: | Artigo |
| Jazyk: | Inglês |
| Vydáno: |
American
Chemical Society
2017
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| On-line přístup: | https://ncbi.nlm.nih.gov/pmc/articles/PMC5465510/ https://ncbi.nlm.nih.gov/pubmed/28508628 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1021/acsami.7b02739 |
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