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Energy Storage Characteristics of BiFeO(3)/BaTiO(3) Bi-Layers Integrated on Si

BiFeO(3)/BaTiO(3) bi-layer thick films (~1 μm) were deposited on Pt/Ti/SiO(2)/(100) Si substrates with LaNiO(3) buffer layers at 500 °C via a rf magnetron sputtering process. X-ray diffraction (XRD) analysis revealed that both BiFeO(3) and BaTiO(3) layers have a (00l) preferred orientation. The film...

詳細記述

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書誌詳細
出版年:Materials (Basel)
主要な著者: Liu, Menglin, Zhu, Hanfei, Zhang, Yunxiang, Xue, Caihong, Ouyang, Jun
フォーマット: Artigo
言語:Inglês
出版事項: MDPI 2016
主題:
オンライン・アクセス:https://ncbi.nlm.nih.gov/pmc/articles/PMC5457274/
https://ncbi.nlm.nih.gov/pubmed/28774055
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3390/ma9110935
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